Electron Microscopy (SEM and TEM)
Module Title - Electron Microscopy (SEM and TEM)
Number of credits – 10
The aim of this module is to develop a capacity for using advanced electron beam analysis to characterise materials. The principles of electron microscopy for imaging, structural and chemical analysis are introduced. Coverage includes: scanning electron microscopy (secondary and backscattered electron imaging), transmission electron microscopy (Mass-thickness contrast, diffraction contrast, phase contrast and electron diffraction), scanning transmission electron microscopy (bright-field, dark-field and high angle annular dark field imaging), and chemical analysis (EDX, WDX and EELS). The basic understanding of the techniques is then used to review the strengths and limitations of the different approaches when applied to materials characterisation.
By the end of the module the student should be able to:
- Appreciate potential and limitations of electron microscopy techniques for materials characterisation;
- Understand principles of imaging contrast mechanisms in SEM and TEM;
- Understand the principles of electron diffraction; Understand principles of chemical microanalysis using electron beams;
- Identify the parameters that could be optimised during the experiment on an electron microscope;
- Interpret the results (images, diffraction patterns or spectra) obtained.