Microscopes
Details of microscopes and ancillary equipment at the Facility for Electron Microscopy.
| Microscope | Worktribe facility number | Electron source | Analytics-EDS | Analytics-EBSD | Analytics-WDS |
|---|---|---|---|---|---|
| SEM-Hitachi TM3030 Desktop | 539 | Tungsten Filament | Oxford Instruments-SwiftID | ||
| SEM-Jeol JSM-6060 | 540 | Tungsten Filament | Oxford Instruments-Inca Xact | ||
| SEM-Zeiss EVO10 Materials | 541 | LaB6 tip | Oxford Instruments-Inca Xact | ||
| SEM-Zeiss EVO15 VP ESEM | 542 | LaB6 tip | Bruker-Quantax Esprit-X Flash 6I60 | Bruker-Quantax Esprit-E Flash FS | |
| SEM-Jeol JSM-7000F | 543 | Field emission gun (FEG) | Oxford Instruments-Aztec-UltimMax | Oxford Instruments-Aztec Nordlys | Oxford Instruments-Inca Wave |
| SEM-FEI FIB Quanta 3D | 544 | Field emission gun (FEG) | Oxford Instruments-Inca Xact | Oxford Instruments-HKL Nordlys | |
| SEM-TF Apreo 2S HiVac | 545 | Field emission gun (FEG) | Thermo Fisher Scientific-ColorSEM UltraDry | ||
| TEM-Jeol JEM-1400 | 546 | Tungsten Filament | |||
| TEM-Jeol JEM-2100 | 547 | LaB6 tip | |||
| TEM-Philips Tecnai F20 | 548 | Field emission gun (FEG) | Oxford Instruments-Aztec Xmax | ||
| SEM-TF Helios 5 Hydra UX TriBeam | 652 | Field emission gun (FEG) | |||
| MicroCT-Nikon X-TEK XT H225 | 653 | Tungsten Filament | |||
| Deben-2kN stage MT2000 (on Apreo) | 654 | N/A | |||
| Quorum PP3010 Cryo-FIB/SEM Preparation System | N/A | N/A | |||